Invention Grant
- Patent Title: Charged particle beam irradiation apparatus
- Patent Title (中): 带电粒子束照射装置
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Application No.: US14063764Application Date: 2013-10-25
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Publication No.: US08766220B2Publication Date: 2014-07-01
- Inventor: Toshiki Tachikawa , Tsuyoshi Ogasawara
- Applicant: Sumitomo Heavy Industries, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2011-099461 20110427
- Main IPC: G21K5/04
- IPC: G21K5/04

Abstract:
A charged particle beam irradiation apparatus includes: an irradiation section configured to irradiate an irradiated body with a charged particle beam; a multi-leaf collimator configured to set an irradiation range of the charged particle beam which is irradiated from the irradiation section; an imaging section that is provided so as to be able to advance and retreat with respect to an irradiation axis of the charged particle beam which is irradiated from the irradiation section, between the irradiation section and the multi-leaf collimator, and directly images an opening portion of the multi-leaf collimator; and a drive section configured to move the imaging section between an imaging position corresponding to an irradiation area which includes the irradiation axis of the charged particle beam and a retreated position away from the irradiation area.
Public/Granted literature
- US20140077098A1 CHARGED PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2014-03-20
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