Invention Grant
- Patent Title: Methods of characterizing a component of a polycrystalline diamond compact by at least one magnetic measurement
- Patent Title (中): 通过至少一种磁测量来表征多晶金刚石致密体的组分的方法
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Application No.: US13790172Application Date: 2013-03-08
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Publication No.: US08766628B2Publication Date: 2014-07-01
- Inventor: Kenneth E. Bertagnolli , Debkumar Mukhopadhyay
- Applicant: US Synthetic Corporation
- Applicant Address: US UT Orem
- Assignee: US Synthetic Corporation
- Current Assignee: US Synthetic Corporation
- Current Assignee Address: US UT Orem
- Agency: Dorsey & Whitney LLP
- Main IPC: G01N27/72
- IPC: G01N27/72
Abstract:
In an embodiment, a method of characterizing a polycrystalline diamond compact is disclosed. The method includes providing the polycrystalline diamond compact, and measuring at least one magnetic characteristic of a component of the polycrystalline diamond compact.
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