Invention Grant
US08766670B2 Sample-and-hold circuit for generating a variable sample delay time of a transformer and method thereof
有权
用于产生变压器的可变采样延迟时间的采样和保持电路及其方法
- Patent Title: Sample-and-hold circuit for generating a variable sample delay time of a transformer and method thereof
- Patent Title (中): 用于产生变压器的可变采样延迟时间的采样和保持电路及其方法
-
Application No.: US13802903Application Date: 2013-03-14
-
Publication No.: US08766670B2Publication Date: 2014-07-01
- Inventor: Ren-Yi Chen , Yi-Lun Shen
- Applicant: Leadtrend Technology Corp.
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Leadtrend Technology Corp.
- Current Assignee: Leadtrend Technology Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: TW101128544A 20120808
- Main IPC: G11C7/02
- IPC: G11C7/02
Abstract:
A sample-and-hold circuit for generating a variable sample delay time of a transformer includes a discharge detection unit, a sample delay time generation unit, and a comparator. The discharge detection unit generates a first voltage according to a first turning-on signal and a first reference current. Length of the first turning-on signal is varied with a discharge time of a present period of the transformer. The sample delay time generation unit generates a second voltage according to the first turning-on signal and a second reference current. The comparator generates a sample signal to a control circuit of the transformer according to a first voltage corresponding to a previous period of the transformer and a second voltage corresponding to the present period of the transformer. The first reference current is K times the second reference current, and 0
Public/Granted literature
- US20140043081A1 SAMPLE-AND-HOLD CIRCUIT FOR GENERATING A VARIABLE SAMPLE DELAY TIME OF A TRANSFORMER AND METHOD THEREOF Public/Granted day:2014-02-13
Information query
