Invention Grant
US08767069B2 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
有权
用于增加使用光分布的粒子成像装置中的测量精度的装置,系统和方法
- Patent Title: Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
- Patent Title (中): 用于增加使用光分布的粒子成像装置中的测量精度的装置,系统和方法
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Application No.: US12827837Application Date: 2010-06-30
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Publication No.: US08767069B2Publication Date: 2014-07-01
- Inventor: Wayne Dennis Roth , Matthew S. Fisher
- Applicant: Wayne Dennis Roth , Matthew S. Fisher
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N7/18

Abstract:
An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a particle in response to a first light source, and processor coupled to the light detector. The processor may be configured create a first image by taking a first measurement of light and create a second image by interpolating the first image, where the second image has higher resolution than the first image. The processor may be configured to determine a difference between pixels of the second image and an expected distribution and discard the first measurement of light if the difference is above a predetermined threshold.
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