Invention Grant
- Patent Title: Immersion lithography system using direction-controlling fluid inlets
- Patent Title (中): 浸入光刻系统采用方向控制流体入口
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Application No.: US13482879Application Date: 2012-05-29
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Publication No.: US08767178B2Publication Date: 2014-07-01
- Inventor: Burn Jeng Lin , Ching-Yu Chang
- Applicant: Burn Jeng Lin , Ching-Yu Chang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G03B27/42
- IPC: G03B27/42

Abstract:
Immersion lithography system and method using direction-controlling fluid inlets are described. According to one embodiment of the present disclosure, an immersion lithography apparatus includes a lens assembly having an imaging lens disposed therein and a wafer stage configured to retain a wafer beneath the lens assembly. The apparatus also includes a plurality of direction-controlling fluid inlets disposed adjacent to the lens assembly, each direction-controlling fluid inlet in the plurality of direction-controlling fluid inlets being configured to direct a flow of fluid beneath the lens assembly and being independently controllable with respect to the other fluid inlets in the plurality of direction-controlling fluid inlets.
Public/Granted literature
- US20120236276A1 Immersion Lithography System Using Direction-Controlling Fluid Inlets Public/Granted day:2012-09-20
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