Invention Grant
- Patent Title: Spectral characteristic measuring device, method for correcting spectral characteristic measuring device, and non-transitory computer readable recording medium
- Patent Title (中): 光谱特性测量装置,用于校正光谱特征测量装置的方法和非暂时性计算机可读记录介质
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Application No.: US14000366Application Date: 2012-02-03
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Publication No.: US08767206B2Publication Date: 2014-07-01
- Inventor: Kenji Imura
- Applicant: Kenji Imura
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agent Cozen O'Connor
- Priority: JP2011-032131 20110217
- International Application: PCT/JP2012/052496 WO 20120203
- International Announcement: WO2012/111455 WO 20120823
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.
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