Invention Grant
- Patent Title: Microscope measurement system
- Patent Title (中): 显微镜测量系统
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Application No.: US12599764Application Date: 2007-05-15
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Publication No.: US08767293B2Publication Date: 2014-07-01
- Inventor: Tzenka Miteva , Piotr Minkin , Gabriele Nelles , Akio Yasuda
- Applicant: Tzenka Miteva , Piotr Minkin , Gabriele Nelles , Akio Yasuda
- Applicant Address: DE Berlin
- Assignee: Sony Deutschland GmbH
- Current Assignee: Sony Deutschland GmbH
- Current Assignee Address: DE Berlin
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/EP2007/004318 WO 20070515
- International Announcement: WO2008/138381 WO 20081120
- Main IPC: G02B21/34
- IPC: G02B21/34

Abstract:
A microscope measurement system including: an optical microscope including a microscope body and an objective connected to the microscope body; a chamber including a support mechanism holding an object to be examined therein, the chamber including an opening inserting the objective into the chamber such that the objective is located essentially within the chamber and the microscope body is located essentially outside of the chamber; a sealing mechanism that provides an essentially gas-tight connection between the optical microscope and the chamber such that the chamber is sealed.
Public/Granted literature
- US20110051235A1 MICROSCOPE MEASUREMENT SYSTEM Public/Granted day:2011-03-03
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B21/00 | 显微镜 |
G02B21/34 | .显微镜载物片,例如,在载物片上安装试样 |