Invention Grant
US08767482B2 Apparatuses, devices and methods for sensing a snapback event in a circuit
有权
用于感测电路中的快速恢复事件的装置,装置和方法
- Patent Title: Apparatuses, devices and methods for sensing a snapback event in a circuit
- Patent Title (中): 用于感测电路中的快速恢复事件的装置,装置和方法
-
Application No.: US13213018Application Date: 2011-08-18
-
Publication No.: US08767482B2Publication Date: 2014-07-01
- Inventor: Jeremy Hirst , Hernan Castro , Stephen Tang
- Applicant: Jeremy Hirst , Hernan Castro , Stephen Tang
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
Example subject matter disclosed herein relates to apparatuses and/or devices, and/or various methods for use therein, in which an application of an electric potential to a circuit may be initiated and subsequently changed in response to a determination that a snapback event has occurred in a circuit. For example, a circuit may comprise a memory cell that may experience a snapback event as a result of an applied electric potential. In certain example implementations, a sense circuit may be provided which is responsive to a snapback event occurring in a memory cell to generate a feed back signal to initiate a change in an electric potential applied to the memory cell.
Public/Granted literature
- US20130044539A1 APPARATUSES, DEVICES AND METHODS FOR SENSING A SNAPBACK EVENT IN A CIRCUIT Public/Granted day:2013-02-21
Information query