Invention Grant
- Patent Title: Measuring device for measurement of parameters in molten masses
- Patent Title (中): 用于测量熔融质量参数的测量装置
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Application No.: US13370901Application Date: 2012-02-10
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Publication No.: US08768113B2Publication Date: 2014-07-01
- Inventor: Jan Cuypers , Marc Straetemans , Valère Indeherberge , Maurice Houbregs
- Applicant: Jan Cuypers , Marc Straetemans , Valère Indeherberge , Maurice Houbregs
- Applicant Address: BE Houthalen
- Assignee: Heraeus Electro-Nite International N.V.
- Current Assignee: Heraeus Electro-Nite International N.V.
- Current Assignee Address: BE Houthalen
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Priority: DE102011012174 20110223
- Main IPC: G02B6/00
- IPC: G02B6/00 ; G02B6/255 ; G01K11/00
Abstract:
A measuring device is provided for measurement of parameters, in particular for measuring the temperature, in molten masses, in particular in molten metal or molten cryolite masses having a melting point above 500° C. The measuring device has an optical fiber for receiving radiation from the molten mass and a cable reel having an external circumference for winding up the optical fiber and an internal space surrounded by the external circumference. A distributor and a mode filter for the optical fiber are arranged in the internal space.
Public/Granted literature
- US20120212728A1 MEASURING DEVICE FOR MEASUREMENT OF PARAMETERS IN MOLTEN MASSES Public/Granted day:2012-08-23
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