Invention Grant
- Patent Title: Physical amount measuring device and physical amount measuring method
- Patent Title (中): 物理量测量装置和物理量测量方法
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Application No.: US13129987Application Date: 2009-11-20
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Publication No.: US08768649B2Publication Date: 2014-07-01
- Inventor: Touru Kitamura , Norihiko Mikoshiba
- Applicant: Touru Kitamura , Norihiko Mikoshiba
- Applicant Address: JP Tokyo
- Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2008-297107 20081120
- International Application: PCT/JP2009/006266 WO 20091120
- International Announcement: WO2010/058594 WO 20100527
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G01C17/38 ; G01C25/00 ; G01P21/00 ; G01P15/18

Abstract:
It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform. The offset included in the obtained vector physical quantity data are statistically estimated based on a predetermined evaluation formula using difference vectors. In the estimation of the offset, reliability information on a reference point is calculated based on at least one of the vector physical quantity data, the difference vectors and a plurality of estimated reference points according to a calculation parameter for calculating the reliability information on the reference point, whether or not the reference point is reliable is determined by comparing the reliability information with a determination threshold value.
Public/Granted literature
- US20110231144A1 PHYSICAL AMOUNT MEASURING DEVICE AND PHYSICAL AMOUNT MEASURING METHOD Public/Granted day:2011-09-22
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