Invention Grant
- Patent Title: Shock test device
- Patent Title (中): 冲击试验装置
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Application No.: US13291789Application Date: 2011-11-08
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Publication No.: US08769178B2Publication Date: 2014-07-01
- Inventor: Chin-Lung Lien , Wei-i Chen , Kuei-Hua Chen
- Applicant: Chin-Lung Lien , Wei-i Chen , Kuei-Hua Chen
- Applicant Address: TW Taipei
- Assignee: Inventec Corporation
- Current Assignee: Inventec Corporation
- Current Assignee Address: TW Taipei
- Agency: CKC & Partners Co., Ltd.
- Priority: TW100132437A 20110908
- Main IPC: G06F13/00
- IPC: G06F13/00 ; H05K7/10 ; G06F3/00

Abstract:
The invention provides a shock test device suitable for an expansion slot of a computer system. The shock test device includes a mainboard, a structure unit and a detection module. The mainboard has a connecting finger electrically connected to the expansion slot. The structure unit is disposed at the mainboard for simulating a weight and a supporting structure. The detection module is coupled to at least one pin of the connecting finger for detecting a touch condition between the connecting finger and the expansion slot so as to produce a warning signal. In this way, the shock test device can detect whether or not a link plug-in in a host computer (for example, the link between the expansion slot and the connecting finger portion of the shock test device) is disconnected due to shocking or unseen disconnected and then reconnected again.
Public/Granted literature
- US20130061682A1 SHOCK TEST DEVICE Public/Granted day:2013-03-14
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