Invention Grant
- Patent Title: Method and apparatus for dynamically instrumenting a program
- Patent Title (中): 用于动态调试程序的方法和装置
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Application No.: US12726705Application Date: 2010-03-18
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Publication No.: US08769504B2Publication Date: 2014-07-01
- Inventor: Jae-hoon Jeong
- Applicant: Jae-hoon Jeong
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2009-0027046 20090330
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00 ; G06F11/36

Abstract:
A dynamic instrumentation method and apparatus which may trace, debug, and profile the execution of a running program without affecting the operation of the program, are provided. According to the method, a break instruction is inserted and executed at start of execution of a first instruction and immediately after execution of the last instruction of a function constituting the program. Environment values of the function before and after execution may be identified. The program may be dynamically instrumented without being affected by any tracing or debugging operations.
Public/Granted literature
- US20100251220A1 METHOD AND APPARATUS FOR DYNAMICALLY INSTRUMENTING A PROGRAM Public/Granted day:2010-09-30
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