Invention Grant
- Patent Title: Pulse-echo method by means of an array-type probe and temperature compensation
- Patent Title (中): 脉冲回波法采用阵列型探头和温度补偿
-
Application No.: US13062032Application Date: 2009-09-07
-
Publication No.: US08770027B2Publication Date: 2014-07-08
- Inventor: York Oberdoerfer , Michael Berke , Wolf-Dietrich Kleinert , Jerome Poirier , Sascha Schieke
- Applicant: York Oberdoerfer , Michael Berke , Wolf-Dietrich Kleinert , Jerome Poirier , Sascha Schieke
- Applicant Address: DE
- Assignee: GE Sensing & Inspection Technologies GmbH
- Current Assignee: GE Sensing & Inspection Technologies GmbH
- Current Assignee Address: DE
- Agency: Cantor Colburn LLP
- Priority: DE102008041835 20080905
- International Application: PCT/EP2009/061581 WO 20090907
- International Announcement: WO2010/026253 WO 20100311
- Main IPC: G01N29/07
- IPC: G01N29/07 ; G01N29/32

Abstract:
The invention relates to a nondestructive ultrasonic test method in which at least one ultrasonic pulse is emitted into a workpiece under test by at least one ultrasonic transmitter (3), the ultrasonic pulse is reflected on boundary surfaces within the workpiece, the reflected ultrasound is received by at least one ultrasonic receiver (2), and the associated signals are evaluated, the ultrasound penetrating a damping block (4) that is arranged between the workpiece and the transmitter or receiver. The method is characterized in that it includes at least one step for determining at least one dimension (alpha, d1, d2) of the damping block (4) that is relevant for the ultrasonic test; in said step, the propagation time of at least one ultrasonic pulse which is generated by the ultrasonic transmitter (3), is reflected on a boundary surface (5) of the damping block (4), and is received by the ultrasonic receiver (2) is measured, and at least one dimension (alpha, d1, d2) of the damping block (4) that is relevant for the ultrasonic test is determined from the measurement.
Public/Granted literature
- US20110247417A1 PULSE-ECHO METHOD BY MEANS OF AN ARRAY-TYPE PROBE AND TEMPERATURE COMPENSATION Public/Granted day:2011-10-13
Information query