Invention Grant
- Patent Title: Apparatus and method for particle analysis
- Patent Title (中): 用于粒子分析的装置和方法
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Application No.: US13386952Application Date: 2009-07-27
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Publication No.: US08770047B2Publication Date: 2014-07-08
- Inventor: Surapol Raadnui
- Applicant: Surapol Raadnui
- Applicant Address: TH Bangkok TH Bangkok
- Assignee: The Thailand Research Fund,King Mongkut's University of Technology North Bangkok
- Current Assignee: The Thailand Research Fund,King Mongkut's University of Technology North Bangkok
- Current Assignee Address: TH Bangkok TH Bangkok
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- International Application: PCT/SG2009/000264 WO 20090727
- International Announcement: WO2011/014119 WO 20110203
- Main IPC: G01N1/22
- IPC: G01N1/22

Abstract:
A method for wear analysis. The method includes introducing a lubricant sample into a tube. The lubricant sample includes debris, wear, or other particles of different sizes. The tube includes a number of filter patches, each of a predetermined pore size. The method further includes centrifuging the tube for displacing the lubricant sample, and the wear particles thereof, along a length of the tube. The filter patches impede passage of wear particles of a size larger than their pore size therethrough, thereby separating the wear particles according to the sizes of the wear particles. The tube is attached to a handler of a centrifuge for centrifugation by the centrifuge. Multiple tubes can be attached to multiple handlers of the centrifuge for simultaneous centrifugation by the centrifuge. Centrifugation tubes (or tubes) are also provided by the present disclosure.
Public/Granted literature
- US20120118051A1 APPARATUS AND METHOD FOR PARTICLE ANALYSIS Public/Granted day:2012-05-17
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