Invention Grant
- Patent Title: Fast wave front measurement
- Patent Title (中): 快波前测量
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Application No.: US13907465Application Date: 2013-05-31
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Publication No.: US08770757B2Publication Date: 2014-07-08
- Inventor: Claudia Gorschboth , Christof Donitzky
- Applicant: Wavelight Laser Technologies AG
- Applicant Address: DE Erlangen
- Assignee: Wavelight Laser Technologie AG
- Current Assignee: Wavelight Laser Technologie AG
- Current Assignee Address: DE Erlangen
- Agency: Haynes and Boone, LLP
- Priority: EP04020783 20040901
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/14

Abstract:
Devices, systems, and methods for measuring wave fronts generated by a lens for an eye are provided. In some embodiments, a device for measuring wave fronts generated by a lens for an eye includes a radiation source for emitting test radiation to be directed at the lens and a sensor device for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation after interaction with the lens at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation after interaction with the lens.
Public/Granted literature
- US20130258288A1 Fast Wave Front Measurement Public/Granted day:2013-10-03
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