Invention Grant
- Patent Title: Edge protection seal for bonded substrates
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Application No.: US13780854Application Date: 2013-02-28
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Publication No.: US08771533B2Publication Date: 2014-07-08
- Inventor: Mukta G. Farooq , Emily Kinser , Richard S. Wise , Hakeem B. S. Akinmade-Yusuff
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Catherine Ivers, Esq.
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
A dielectric material layer is deposited on exposed surfaces of a bonded structure that includes a first substrate and a second substrate. The dielectric material layer is formed on an exposed planar surface of a second substrate and the entirety of peripheral sidewalls of the first and second substrates. The dielectric material layer can be formed by chemical vapor deposition, atomic layer deposition, or plasma induced deposition. Further, the dielectric material layer seals the entire periphery of the interface between the first and second substrates. If a planar portion of the dielectric material layer can be removed by planarization to facilitate thinning of the bonded structure, the remaining portion of the dielectric material layer can form a dielectric ring.
Public/Granted literature
- US20130168017A1 EDGE PROTECTION SEAL FOR BONDED SUBSTRATES Public/Granted day:2013-07-04
Information query
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