Invention Grant
- Patent Title: Method for coating measurement
- Patent Title (中): 涂层测量方法
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Application No.: US13509917Application Date: 2010-10-15
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Publication No.: US08771785B2Publication Date: 2014-07-08
- Inventor: Larry Eugene Steenhoek , Allan Blase Joseph Rodrigues , Gerard T. Brosmer , David Lee Griffus
- Applicant: Larry Eugene Steenhoek , Allan Blase Joseph Rodrigues , Gerard T. Brosmer , David Lee Griffus
- Applicant Address: US DE Wilmington
- Assignee: Axalta Coating Systems IP Co., LLC
- Current Assignee: Axalta Coating Systems IP Co., LLC
- Current Assignee Address: US DE Wilmington
- Agency: Ingrassia Fisher & Lorenz, P.C.
- International Application: PCT/US2010/052869 WO 20101015
- International Announcement: WO2011/075212 WO 20110623
- Main IPC: B05D1/38
- IPC: B05D1/38

Abstract:
The present invention is directed to a method for obtaining characteristics of a target coating layer. Specifically, a clearcoat layer is provided over a target coating layer for measuring color and appearance characteristics of the target coating. The clearcoat layer can comprise materials from renewable resources. The present invention is also directed to a system for obtaining characteristics of the target coating layer.
Public/Granted literature
- US20120225190A1 METHOD FOR COATING MEASUREMENT Public/Granted day:2012-09-06
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