Invention Grant
US08772099B2 Method of use of a field-effect transistor, single-electron transistor and sensor
有权
使用场效应晶体管,单电子晶体管和传感器的方法
- Patent Title: Method of use of a field-effect transistor, single-electron transistor and sensor
- Patent Title (中): 使用场效应晶体管,单电子晶体管和传感器的方法
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Application No.: US13556314Application Date: 2012-07-24
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Publication No.: US08772099B2Publication Date: 2014-07-08
- Inventor: Kazuhiko Matsumoto , Atsuhiko Kojima , Satoru Nagao , Masanori Katou , Yutaka Yamada , Kazuhiro Nagaike , Yasuo Ifuku , Hiroshi Mitani
- Applicant: Kazuhiko Matsumoto , Atsuhiko Kojima , Satoru Nagao , Masanori Katou , Yutaka Yamada , Kazuhiro Nagaike , Yasuo Ifuku , Hiroshi Mitani
- Applicant Address: JP Saitama
- Assignee: Japan Science and Technology Agency
- Current Assignee: Japan Science and Technology Agency
- Current Assignee Address: JP Saitama
- Agency: Katten Muchin Rosenman LLP
- Priority: JP2003-307798 20030829
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of detecting a detection target using a sensor requires a sensor having a transistor selected from the group of field-effect transistors or single electron transistors. The transistor includes a substrate, a source electrode disposed on the substrate and a drain electrode disposed on the substrate, and a channel forming a current path between the source electrode and the drawing electrode; an interaction-sensing gate comprising a specific substance; and a voltage gate. The method includes (a) providing the detection target on the interaction-sensing gate; (b) setting the gate voltage in the voltage gate at a predetermined level; (c) selectively interacting the specific substance with the detection target; (d) when the detection target interacts with the specific substance, changing a gate voltage in the voltage gate to adjust a characteristic of the transistor; and (e) measuring a change in the characteristic of the transistor to determine a presence of the detection target.
Public/Granted literature
- US20120286763A1 METHOD OF USE OF A FIELD-EFFECT TRANSISTOR, SINGLE-ELECTRON TRANSISTOR AND SENSOR Public/Granted day:2012-11-15
Information query
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