Invention Grant
- Patent Title: System and method for Hilbert phase imaging
- Patent Title (中): 希尔伯特相位成像系统和方法
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Application No.: US11389670Application Date: 2006-03-24
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Publication No.: US08772693B2Publication Date: 2014-07-08
- Inventor: Gabriel Popescu , Ramachandra Dasari , Michael Feld , Takahiro Ikeda
- Applicant: Gabriel Popescu , Ramachandra Dasari , Takahiro Ikeda
- Applicant Address: US MA Cambridge JP Hamamatsu
- Assignee: Massachusetts Institute of Technology,Hamamatsu Photonics K.K.
- Current Assignee: Massachusetts Institute of Technology,Hamamatsu Photonics K.K.
- Current Assignee Address: US MA Cambridge JP Hamamatsu
- Agency: McCarter & English, LLP
- Main IPC: H01L27/00
- IPC: H01L27/00

Abstract:
Hilbert phase microscopy (HPM) as an optical technique for measuring high transverse resolution quantitative phase images associated with optically transparent objects. Due to its single-shot nature, HPM is suitable for investigating rapid phenomena that take place in transparent structures such as biological cells. A preferred embodiment is used for measuring biological systems including measurements on red blood cells, while its ability to quantify dynamic processes on the millisecond scale, for example, can be illustrated with measurements on evaporating micron-size water droplets.
Public/Granted literature
- US20060291712A1 System and method for Hilbert phase imaging Public/Granted day:2006-12-28
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