Invention Grant
- Patent Title: Directionally etched nanowire field effect transistors
- Patent Title (中): 定向蚀刻纳米线场效应晶体管
-
Application No.: US13550700Application Date: 2012-07-17
-
Publication No.: US08772755B2Publication Date: 2014-07-08
- Inventor: Sarunya Bangsaruntip , Guy M. Cohen , Jeffrey W. Sleight
- Applicant: Sarunya Bangsaruntip , Guy M. Cohen , Jeffrey W. Sleight
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H01L29/72
- IPC: H01L29/72

Abstract:
A nanowire field effect transistor (FET) device, includes a source region comprising a first semiconductor layer disposed on a second semiconductor layer, the source region having a surface parallel to {110} crystalline planes and opposing sidewall surfaces parallel to the {110} crystalline planes, a drain region comprising the first semiconductor layer disposed on the second semiconductor layer, the source region having a face parallel to the {110} crystalline planes and opposing sidewall surfaces parallel to the {110} crystalline planes, and a nanowire channel member suspended by the source region and the drain region, wherein nanowire channel includes the first semiconductor layer, and opposing sidewall surfaces parallel to {100} crystalline planes and opposing faces parallel to the {110} crystalline planes.
Public/Granted literature
- US20120280204A1 DIRECTIONALLY ETCHED NANOWIRE FIELD EFFECT TRANSISTORS Public/Granted day:2012-11-08
Information query
IPC分类: