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US08772866B2 Semiconductor device and method for fabricating the same 失效
半导体装置及其制造方法

  • Patent Title: Semiconductor device and method for fabricating the same
  • Patent Title (中): 半导体装置及其制造方法
  • Application No.: US12650436
    Application Date: 2009-12-30
  • Publication No.: US08772866B2
    Publication Date: 2014-07-08
  • Inventor: Sung Pyo Hong
  • Applicant: Sung Pyo Hong
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2009-0069072 20090728
  • Main IPC: H01L29/66
  • IPC: H01L29/66
Semiconductor device and method for fabricating the same
Abstract:
A semiconductor device comprises a buried gate formed by being buried under a surface of a semiconductor substrate, a dummy gate formed on the buried gate, and a landing plug formed on a junction region of the semiconductor substrate being adjacent to the dummy gate.
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