Invention Grant
- Patent Title: Tunnel field-effect transistor
- Patent Title (中): 隧道场效应晶体管
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Application No.: US13551785Application Date: 2012-07-18
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Publication No.: US08772877B2Publication Date: 2014-07-08
- Inventor: Mikael T Bjoerk , Andreas Christian Doering , Phillip Stanley-Marbell , Kirsten Emilie Moselund
- Applicant: Mikael T Bjoerk , Andreas Christian Doering , Phillip Stanley-Marbell , Kirsten Emilie Moselund
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Vazken Alexanian
- Priority: EP11175123 20110722
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A tunnel field-effect transistor including at least: a source region including a corresponding source semiconductor material; a drain region including a corresponding drain semiconductor material, and a channel region including a corresponding channel semiconductor material, which is arranged between the source region and the drain region. The tunnel field-effect transistor further includes at least: a source-channel gate electrode provided on an interface between the source region and the channel region; an insulator corresponding to the source-channel gate electrode that is provided between the source-channel gate electrode and the interface between the source region and the channel region; a drain-channel gate electrode provided on an interface between the drain region and the channel region; and an insulator corresponding to the drain-channel gate electrode that is provided between the drain-channel gate electrode and the interface between the drain region and the channel region.
Public/Granted literature
- US20130021061A1 TUNNEL FIELD-EFFECT TRANSISTOR Public/Granted day:2013-01-24
Information query
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