Invention Grant
- Patent Title: MTJ MRAM with stud patterning
- Patent Title (中): MTJ MRAM螺柱图案
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Application No.: US13572197Application Date: 2012-08-10
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Publication No.: US08772888B2Publication Date: 2014-07-08
- Inventor: Dong Ha Jung , Kimihiro Satoh , Jing Zhang , Yuchen Zhou , Yiming Huai
- Applicant: Dong Ha Jung , Kimihiro Satoh , Jing Zhang , Yuchen Zhou , Yiming Huai
- Applicant Address: US CA Fremont
- Assignee: Avalanche Technology Inc.
- Current Assignee: Avalanche Technology Inc.
- Current Assignee Address: US CA Fremont
- Agent G. Marlin Knight
- Main IPC: H01L43/00
- IPC: H01L43/00 ; H01L43/12

Abstract:
Use of a multilayer etching mask that includes a stud mask and a removable spacer sleeve for MTJ etching to form a bottom electrode that is wider than the rest of the MTJ pillar is described. The first embodiment of the invention described includes a top electrode and a stud mask. In the second and third embodiments the stud mask is a conductive material and also serves as the top electrode. In embodiments after the stud mask is formed a spacer sleeve is formed around it to initially increase the masking width for a phase of etching. The spacer is removed for further etching, to create step structures that are progressively transferred down into the layers forming the MTJ pillar. In one embodiment the spacer sleeve is formed by net polymer deposition during an etching phase.
Public/Granted literature
- US20140042567A1 MTJ MRAM WITH STUD PATTERNING Public/Granted day:2014-02-13
Information query
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