Invention Grant
- Patent Title: Apparatus and method of detecting electromagnetic radiation
- Patent Title (中): 电磁辐射检测装置及方法
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Application No.: US12247096Application Date: 2008-10-07
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Publication No.: US08772890B2Publication Date: 2014-07-08
- Inventor: Igor Kukushkin , Viacheslav Muravev
- Applicant: Igor Kukushkin , Viacheslav Muravev
- Applicant Address: US CA Torrance
- Assignee: Terasense Group, Inc.
- Current Assignee: Terasense Group, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Seppo Laine Oy
- Agent Joshua P. Wert
- Main IPC: H01L27/14
- IPC: H01L27/14

Abstract:
A high speed and miniature detection system, especially for electromagnetic radiation in the GHz and THz range comprises a semiconductor structure having a 2D charge carrier layer or a quasi 2D charge carrier layer with incorporated single or multiple defects, at least first and second contacts to the charge carrier layer, and a device for measuring photovoltage between the first and second contacts. System operation in various embodiments relies on resonant excitation of plasma waves in the semiconductor structure.
Public/Granted literature
- US20100084630A1 Apparatus and Method of Detecting Electromagnetic Radiation Public/Granted day:2010-04-08
Information query
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