Invention Grant
US08772952B2 Semiconductor device with copper wire having different width portions 有权
具有不同宽度部分的铜线的半导体器件

Semiconductor device with copper wire having different width portions
Abstract:
To improve reliability of a semiconductor device in which wire bonding using a wire made of copper is performed. A semiconductor device is configured so that one of end parts (wide width part) of a copper wire is joined via a bump on a pad (electrode pad) formed over a main surface (first main surface) of a semiconductor chip of the semiconductor device. The bump is made of gold, which is a metal material having a hardness lower than that of copper, and the width of the bump is narrower than the width of the wide width part of the wire.
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