Invention Grant
- Patent Title: System and method for inspection of electrical circuits
- Patent Title (中): 电路检查系统及方法
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Application No.: US13190926Application Date: 2011-07-26
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Publication No.: US08773140B2Publication Date: 2014-07-08
- Inventor: Sam-Soo Jung , Raul Martin
- Applicant: Sam-Soo Jung , Raul Martin
- Applicant Address: US CA San Jose
- Assignee: Photon Dynamics, Inc
- Current Assignee: Photon Dynamics, Inc
- Current Assignee Address: US CA San Jose
- Agency: Sughrue Mion, PLLC
- Main IPC: G01R31/08
- IPC: G01R31/08
Abstract:
A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.
Public/Granted literature
- US20130027050A1 SYSTEM AND METHOD FOR INSPECTION OF ELECTRICAL CIRCUITS Public/Granted day:2013-01-31
Information query
