Invention Grant
- Patent Title: Mounting structure for a continuity testing unit
- Patent Title (中): 连续性测试单元的安装结构
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Application No.: US13137010Application Date: 2011-07-15
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Publication No.: US08773154B2Publication Date: 2014-07-08
- Inventor: Kozo Kogasumi
- Applicant: Kozo Kogasumi
- Applicant Address: JP Tokyo
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Tokyo
- Agency: Edwards Wildman Palmer LLP
- Priority: JP2010-170723 20100729
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A mounting structure for a continuity testing unit is provided in which the plurality of continuity testing units can easily be mounted to or removed from a test board without using the bolt or the intricately-shaped pin, and which improves the efficiency of restoring the mounting arrangement of the continuity testing units. The mounting structure for a continuity testing unit includes a plurality of parallely-arranged rails arranged at a frame, a joint block arranged on the respective rails and a plurality of continuity testing units each including a plate portion and a pin portion arranged at the plate portion. The joint block includes a plurality of holes into which the pin portion is fitted in a disengageable manner. The plurality of holes is arranged in two lines. The plate portion is placed on the joint blocks on the two adjacent rails.
Public/Granted literature
- US20120025044A1 Mounting structure for a continuity testing unit Public/Granted day:2012-02-02
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