Invention Grant
- Patent Title: Measurement of insulation resistance of configurable photovoltaic panels in a photovoltaic array
- Patent Title (中): 光伏阵列中可配置光伏板的绝缘电阻的测量
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Application No.: US13412480Application Date: 2012-03-05
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Publication No.: US08773156B2Publication Date: 2014-07-08
- Inventor: Shinichi Takada , Toru Takehara
- Applicant: Shinichi Takada , Toru Takehara
- Applicant Address: US CA Hayward
- Assignee: Applied Core Technologies, Inc.
- Current Assignee: Applied Core Technologies, Inc.
- Current Assignee Address: US CA Hayward
- Agency: GSS Law Group
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Methods for measuring insulation resistance in a photovoltaic (PV) array may include partitioning the PV array into groups of PV panels, isolating a group of PV panels selected for an insulation resistance measurement from other groups of panels by setting bypass selectors on each PV panel in the PV array, and making an insulation resistance measurement for the selected group. If a measured value of insulation resistance for a selected group corresponds to an insulation problem in a PV array component, a separate measurement of insulation resistance may be made for each PV panel in the selected group. Insulation resistance measurements may be made accurately and rapidly for large PV arrays without disconnecting and reconnecting cables between panels. Measurements may be made at frequent, regular intervals to permit changes in insulation resistance to be detected before damage from dielectric breakdown occurs.
Public/Granted literature
- US20120223734A1 MEASUREMENT OF INSULATION RESISTANCE OF CONFIGURABLE PHOTOVOLTAIC PANELS IN A PHOTOVOLTAIC ARRAY Public/Granted day:2012-09-06
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