Invention Grant
- Patent Title: Calibration of delay chains
- Patent Title (中): 延迟链的校准
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Application No.: US13681606Application Date: 2012-11-20
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Publication No.: US08773185B2Publication Date: 2014-07-08
- Inventor: Sivaramakrishnan Subramanian , Nidhir Kumar , Sridhar Cheruku
- Applicant: ARM Limited
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Nixon & Vanderhye P.C.
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A calibratable delay chain having a delay chain and an adjustment circuitry varying a delay of each of the plurality of delay stages in the chain. The calibration circuitry is configured to calibrate a delay of the delay chain. The calibration circuitry includes calibration control circuitry for controlling the calibration and supplying the input value to an adjustment circuitry. Output selection circuitry is provided to select an output from a predetermined point along the delay chain. A bypass path bypasses the delay chain and a digital comparator compares an output from the delay chain and an output from the bypass path. An analogue comparator compares an output from the delay chain and an output from the bypass path. The calibration control circuitry is configured to control the output selection circuitry to output a signal from one point on the delay chain to the digital comparator.
Public/Granted literature
- US20140139277A1 CALIBRATION OF DELAY CHAINS Public/Granted day:2014-05-22
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