Invention Grant
- Patent Title: Inspection device
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Application No.: US13240770Application Date: 2011-09-22
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Publication No.: US08773524B2Publication Date: 2014-07-08
- Inventor: Saori Matsumoto
- Applicant: Saori Matsumoto
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: JP2010-222242 20100930
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
The present invention provides an inspection device including an imaging unit 16 for imaging an object to be inspected, a characteristics measurement unit 15 for measuring characteristics of the object to be inspected, an inspection information acquisition unit 11 for acquiring inspection information related to the object to be inspected, a condition determination unit 12 for determining measurement information related to a measurement condition of the object to be inspected corresponding to the inspection information, an imaging control unit 14 for controlling imaging by the imaging unit, and a measurement control unit 13 for controlling measurement by the characteristics measurement unit based on the measurement information.
Public/Granted literature
- US08836779B2 Inspection device Public/Granted day:2014-09-16
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