Invention Grant
US08773527B2 System and method for capturing debug information using a peripheral device
有权
使用外围设备捕获调试信息的系统和方法
- Patent Title: System and method for capturing debug information using a peripheral device
- Patent Title (中): 使用外围设备捕获调试信息的系统和方法
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Application No.: US11845587Application Date: 2007-08-27
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Publication No.: US08773527B2Publication Date: 2014-07-08
- Inventor: Byung Kang , Paul Suntae Kim , Tae Hee Kim , Jason Rowe
- Applicant: Byung Kang , Paul Suntae Kim , Tae Hee Kim , Jason Rowe
- Applicant Address: KR Suwon
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon
- Agency: Sherman & Zarrabian LLP
- Agent Kenneth L. Sherman, Esq.; Michael Zarrabian, Esq.
- Main IPC: H04N7/18
- IPC: H04N7/18
Abstract:
A system and method for capturing debug information are disclosed. In one aspect, a method comprises connecting a portable test device having a memory and no processor to a television, the test device having stored therein a debug program configured to be executed by a control unit of the television to capture debug information from the television and store the captured debug information on the test device.
Public/Granted literature
- US20090059000A1 SYSTEM AND METHOD FOR CAPTURING DEBUG INFORMATION USING A PERIPHERAL DEVICE Public/Granted day:2009-03-05
Information query
