Invention Grant
US08773895B2 Ultra low power memory cell with a supply feedback loop configured for minimal leakage operation 有权
具有电源反馈回路的超低功耗存储单元,其配置为最小的泄漏操作

Ultra low power memory cell with a supply feedback loop configured for minimal leakage operation
Abstract:
A memory cell with an internal supply feedback loop is provided herein. The memory cell includes a latch having two storage nodes Q and QB, and a supply node. A gating device couples the supply node of the latch to the supply voltage. The gating device is controlled by a feedback loop coming from storage node QB. Due to the aforementioned asymmetric topology, the writing of logic “1” and the writing of logic “0” are carried out differently. Contrary to standard SRAM cells, in the hold states, only the QB storage node presents a valid value of stored data. The feedback loop cuts off the supply voltage for the latch such that the latch is no longer an inverting latch. By cutting off the supply voltage at the stable hold states, while maintaining readability of the memory cell, leakage currents associated with the hold states are eliminated altogether.
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