Invention Grant
US08773901B2 Nonvolatile memory device preventing shift in threshold voltage of erase cell and program method thereof 有权
防止擦除单元的阈值电压偏移的非易失性存储器件及其编程方法

  • Patent Title: Nonvolatile memory device preventing shift in threshold voltage of erase cell and program method thereof
  • Patent Title (中): 防止擦除单元的阈值电压偏移的非易失性存储器件及其编程方法
  • Application No.: US13178985
    Application Date: 2011-07-08
  • Publication No.: US08773901B2
    Publication Date: 2014-07-08
  • Inventor: Jin Su Park
  • Applicant: Jin Su Park
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2010-0066487 20100709
  • Main IPC: G11C11/34
  • IPC: G11C11/34
Nonvolatile memory device preventing shift in threshold voltage of erase cell and program method thereof
Abstract:
A program method of a nonvolatile memory device includes programming data of a first bit into a target page of a plurality of pages in a memory cell array, sensing the programmed data and storing the sensed data in a page buffer coupled to the memory cell array, erasing data of the target page, inputting data of a second bit to the page buffer and generating program data by combining the data of the second bit and the data of the first bit stored in the page buffer, and programming the program data into the target page.
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