Invention Grant
US08773916B2 Nonvolatile memory device, system and programming method with dynamic verification mode selection
有权
非易失存储器件，具有动态校验模式选择的系统和编程方法
- Patent Title: Nonvolatile memory device, system and programming method with dynamic verification mode selection
- Patent Title (中): 非易失存储器件，具有动态校验模式选择的系统和编程方法
-
Application No.: US13919010Application Date: 2013-06-17
-
Publication No.: US08773916B2Publication Date: 2014-07-08
- Inventor: Moo Sung Kim
- Applicant: Moo Sung Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2010-0051190 20100531
- Main IPC: G11C16/06
- IPC: G11C16/06
Abstract:
Nonvolatile memory devices, memory systems and related methods of operating nonvolatile memory devices are presented. During a programming operation, the nonvolatile memory device is capable of using bit line forcing, and is also capable of selecting a verification mode for use during a verification operation from a group of verification modes on the basis of an evaluated programming condition.
Public/Granted literature
- US20130279264A1 NONVOLATILE MEMORY DEVICE, SYSTEM AND PROGRAMMING METHOD WITH DYNAMIC VERIFICATION MODE SELECTION Public/Granted day:2013-10-24
Information query
