Invention Grant
US08775107B2 Measurement and apparatus for electrical measurement of electrical drive parameters for a MEMS based display
失效
用于基于MEMS的显示器的电驱动参数的电测量的测量和装置
- Patent Title: Measurement and apparatus for electrical measurement of electrical drive parameters for a MEMS based display
- Patent Title (中): 用于基于MEMS的显示器的电驱动参数的电测量的测量和装置
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Application No.: US13526192Application Date: 2012-06-18
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Publication No.: US08775107B2Publication Date: 2014-07-08
- Inventor: Alok Govil , Kostadin Djordjev , Alan Lewis , Wilhelmus Johannes Robertus Van Lier
- Applicant: Alok Govil , Kostadin Djordjev , Alan Lewis , Wilhelmus Johannes Robertus Van Lier
- Applicant Address: US CA San Diego
- Assignee: Qualcomm MEMS Technologies, Inc.
- Current Assignee: Qualcomm MEMS Technologies, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; B81C99/00 ; G09G3/00 ; G09G3/34 ; G09G5/00
Abstract:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
Public/Granted literature
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