Invention Grant
US08775745B2 Process variation tolerant bank collision detection circuit 有权
过程变异容限库碰撞检测电路

Process variation tolerant bank collision detection circuit
Abstract:
A process variation tolerant collision detection apparatus for use in detecting collisions in a multibank memory. The apparatus may receive a plurality of memory commands for execution at the multibank memory. The plurality of memory commands may be compared by an index address comparator and a bank address comparator to generate an index match signal and a bank match signal. The index match signal and the bank match signal may be analyzed by a timing correction module such that errors associated with process variation of the signals used in the system may be eliminated. Accordingly, a corrected index match signal and a corrected bank match signal may be provided to a collision detection circuit to determine whether a collision exits.
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