Invention Grant
- Patent Title: Process variation tolerant bank collision detection circuit
- Patent Title (中): 过程变异容限库碰撞检测电路
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Application No.: US13618195Application Date: 2012-09-14
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Publication No.: US08775745B2Publication Date: 2014-07-08
- Inventor: Jungyong Lee , Singrong Li , Heechoul Park
- Applicant: Jungyong Lee , Singrong Li , Heechoul Park
- Applicant Address: US CA Redwood City
- Assignee: Oracle International Corporation
- Current Assignee: Oracle International Corporation
- Current Assignee Address: US CA Redwood City
- Agency: Marsh Fischmann & Breyfogle LLP
- Main IPC: G06F12/08
- IPC: G06F12/08 ; G06F11/00 ; G06F12/14

Abstract:
A process variation tolerant collision detection apparatus for use in detecting collisions in a multibank memory. The apparatus may receive a plurality of memory commands for execution at the multibank memory. The plurality of memory commands may be compared by an index address comparator and a bank address comparator to generate an index match signal and a bank match signal. The index match signal and the bank match signal may be analyzed by a timing correction module such that errors associated with process variation of the signals used in the system may be eliminated. Accordingly, a corrected index match signal and a corrected bank match signal may be provided to a collision detection circuit to determine whether a collision exits.
Public/Granted literature
- US20140082321A1 PROCESS VARIATION TOLERANT BANK COLLISION DETECTION CIRCUIT Public/Granted day:2014-03-20
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