Invention Grant
US08779635B2 Arrangement of reticle positioning device for actinic inspection of EUV reticles
有权
EUV光罩的光化学检测用掩模版定位装置的布置
- Patent Title: Arrangement of reticle positioning device for actinic inspection of EUV reticles
- Patent Title (中): EUV光罩的光化学检测用掩模版定位装置的布置
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Application No.: US13859618Application Date: 2013-04-09
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Publication No.: US08779635B2Publication Date: 2014-07-15
- Inventor: Pradeep Subrahmanyan , Mark Williams , Samir Nayfeh
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Simpson & Simpson, PLLC
- Main IPC: H02K41/00
- IPC: H02K41/00 ; H02K3/00

Abstract:
A reticle positioning apparatus for actinic EUV reticle inspection including a sealed inspection chamber containing a reticle stage for holding a reticle. The reticle stage has a magnetically suspended upper stage with a long travel in a “y” direction and a magnetically suspended lower stage with a long travel in an “x” direction; and a cable stage chamber isolated from the inspection chamber by a cable chamber wall. The cable stage chamber has a cable stage movable in the “y” direction; and a tube connected at one end to the reticle stage and to the cable stage at the other end. The tube passes from the cable stage through the inspection chamber through a seal in the chamber wall and opening into the cable entry chamber for entry of cables and hoses within the cable stage chamber, which cables and hoses pass through the tube to the reticle stage.
Public/Granted literature
- US20130264494A1 ARRANGEMENT OF RETICLE POSITIONING DEVICE FOR ACTINIC INSPECTION OF EUV RETICLES Public/Granted day:2013-10-10
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