Invention Grant
- Patent Title: Exposure apparatus and method for producing device
- Patent Title (中): 曝光装置及其制造方法
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Application No.: US13064867Application Date: 2011-04-21
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Publication No.: US08780327B2Publication Date: 2014-07-15
- Inventor: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2003-146423 20030523; JP2003-305280 20030828; JP2004-049231 20040225
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52 ; G03F7/20

Abstract:
An exposure apparatus includes an optical element via which a patterned beam is projected onto a substrate through exposure liquid filled in a space between the optical element and the substrate. The apparatus also includes a member having a flow passage in which exposure liquid flows, the flow passage being in fluidic communication with the space. The apparatus also includes a cleaning system which cleans the member.
Public/Granted literature
- US20110199594A1 Exposure apparatus and method for producing device Public/Granted day:2011-08-18
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