Invention Grant
US08780331B2 Evaluation device, measuring arrangement and method for path length measurement and measuring system and method for a coordinate measuring device and coordinate measuring device 有权
轨迹长度测量的测量装置,测量装置和方法以及坐标测量装置和坐标测量装置的测量系统和方法

  • Patent Title: Evaluation device, measuring arrangement and method for path length measurement and measuring system and method for a coordinate measuring device and coordinate measuring device
  • Patent Title (中): 轨迹长度测量的测量装置,测量装置和方法以及坐标测量装置和坐标测量装置的测量系统和方法
  • Application No.: US13377440
    Application Date: 2010-06-10
  • Publication No.: US08780331B2
    Publication Date: 2014-07-15
  • Inventor: Bernd SpruckFrank HoellerCristina Alvarez Diez
  • Applicant: Bernd SpruckFrank HoellerCristina Alvarez Diez
  • Applicant Address: DE Oberkochen
  • Assignee: Carl Zeiss AG
  • Current Assignee: Carl Zeiss AG
  • Current Assignee Address: DE Oberkochen
  • Agency: Sand & Sebolt
  • Priority: DE102009024464 20090610
  • International Application: PCT/EP2010/058138 WO 20100610
  • International Announcement: WO2010/142757 WO 20101216
  • Main IPC: G01C3/08
  • IPC: G01C3/08
Evaluation device, measuring arrangement and method for path length measurement and measuring system and method for a coordinate measuring device and coordinate measuring device
Abstract:
An evaluation device for path length measurement configured to evaluate a measured signal representing an intensity of a sequence of pulses of electromagnetic radiation, particularly a sequence of light pulses, as a function of time, after the sequence has traveled through a path length to be measured. The sequence of light pulses is generated with a repetition rate by a radiation source, particularly a light source. The evaluation device is configured to evaluate a first component of the measured signal, which oscillates with a first frequency, and a second component of the measured signal, which the second component oscillates with a second frequency that is greater than the first frequency. The first frequency may correspond to the repetition rate or a multiple of the repetition rate. The second frequency may correspond to another multiple of the repetition rate.
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