Invention Grant
- Patent Title: Electro-optical distance measuring method and electro-optical distance measuring device
- Patent Title (中): 电光距离测量方法和电光距离测量装置
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Application No.: US13144196Application Date: 2009-12-25
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Publication No.: US08781780B2Publication Date: 2014-07-15
- Inventor: Mitsuru Kanokogi , Masahiro Ohishi
- Applicant: Mitsuru Kanokogi , Masahiro Ohishi
- Applicant Address: KR Tokyo-to
- Assignee: Kabushiki Kaisha TOPCON
- Current Assignee: Kabushiki Kaisha TOPCON
- Current Assignee Address: KR Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2009-012099 20090122
- International Application: PCT/JP2009/071898 WO 20091225
- International Announcement: WO2010/084700 WO 20100729
- Main IPC: G01C25/00
- IPC: G01C25/00

Abstract:
The present invention provides an electro-optical distance measurement, wherein a light from a light source (6) is projected toward an object to be measured (2), a reflection light reflected by the object to be measured is received at a photodetection unit (8), the light from the light source is received by the photodetection unit as an inner light via an inner optical path (11), and a distance to the object to be measured is measured according to the result of photodetection of the reflection light and the inner light of the photodetection unit, and wherein a correction information is acquired based on the inner light, the acquired correction information is stored, a correction value is obtained from the correction information based on the reflection light and the inner light, and a distance is calculated from the correction value and the result of photodetection of the reflection light and the inner light.
Public/Granted literature
- US20110270563A1 Electro-Optical Distance Measuring Method And Electro-Optical Distance Measuring Device Public/Granted day:2011-11-03
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