Invention Grant
- Patent Title: Light emission analyzing device
- Patent Title (中): 发光分析装置
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Application No.: US14119487Application Date: 2012-05-22
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Publication No.: US08781793B2Publication Date: 2014-07-15
- Inventor: Masaki Yamashita , Hiromi Mizukawa
- Applicant: Masaki Yamashita , Hiromi Mizukawa
- Applicant Address: JP Osaka
- Assignee: CREV Inc.
- Current Assignee: CREV Inc.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, LLP.
- Priority: JP2011-117461 20110525
- International Application: PCT/JP2012/003326 WO 20120522
- International Announcement: WO2012/160804 WO 20121129
- Main IPC: G01K11/30
- IPC: G01K11/30 ; G01B5/02 ; G01B5/14 ; G01B7/02 ; G01B7/14 ; G01B11/02 ; G01B11/14 ; G01B13/02 ; G01C22/00 ; G01J3/00 ; G01B9/02

Abstract:
The light emission analyzing device includes: a first light intensity calculation unit that performs polynomial approximation on a spectroscopic spectrum indicating a light intensity for each wavelength in a container as measured by a spectrometer so as to calculate the light intensity; a second light intensity calculation unit that subtracts, for each wavelength, the light intensity calculated by the first light intensity calculation unit from the light intensity indicated by the spectroscopic spectrum measured by the spectrometer so as to calculate a light intensity corresponding to a bright-line spectrum of a molecule; and a ratio calculation unit that calculates, by using the light intensity calculated by the second light intensity calculation unit, a ratio between (a) a peak value of a molecular spectrum of a first molecule and (b) a peak value of a molecular spectrum of a second molecule.
Public/Granted literature
- US20140107980A1 LIGHT EMISSION ANALYZING DEVICE Public/Granted day:2014-04-17
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