Invention Grant
- Patent Title: Optical analysis method using the light intensity of a single light-emitting particle
- Patent Title (中): 使用单个发光粒子的光强的光学分析方法
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Application No.: US13788972Application Date: 2013-03-07
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Publication No.: US08785886B2Publication Date: 2014-07-22
- Inventor: Kazutaka Nishikawa , Tetsuya Tanabe , Mitsushiro Yamaguchi
- Applicant: Olympus Corporation
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-202995 20100910
- Main IPC: G01N21/64
- IPC: G01N21/64 ; H01J65/06 ; G01N15/14

Abstract:
There is provided a scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope, enabling characterization of a light-emitting particle or identification of a light-emitting particle with emitted light intensity of a single light-emitting particle measured individually. In the inventive optical analysis technique, with reference to the ratio of the intensities of simultaneously generated signals of the lights of at least two light-emitting sites having mutually different emission wavelengths, possessed by a light-emitting particle contained in a sample solution, the intensities being measured with moving the position of the light detection region of an optical system by changing the optical path of the optical system, a single light-emitting particle corresponding to the signals is identified, and the kind, the size, etc. of the light-emitting particle is identified.
Public/Granted literature
- US20130228705A1 OPTICAL ANALYSIS METHOD USING THE LIGHT INTENSITY OF A SINGLE LIGHT-EMITTING PARTICLE Public/Granted day:2013-09-05
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