Invention Grant
US08786844B2 Apparatus for measuring optical characteristics including position detection
失效
用于测量包括位置检测在内的光学特性的装置
- Patent Title: Apparatus for measuring optical characteristics including position detection
- Patent Title (中): 用于测量包括位置检测在内的光学特性的装置
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Application No.: US13604420Application Date: 2012-09-05
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Publication No.: US08786844B2Publication Date: 2014-07-22
- Inventor: Wayne D. Jung , Russell W. Jung , Alan R. Loudermilk
- Applicant: Wayne D. Jung , Russell W. Jung , Alan R. Loudermilk
- Applicant Address: US TX Marshall
- Assignee: 511 Innovations, Inc.
- Current Assignee: 511 Innovations, Inc.
- Current Assignee Address: US TX Marshall
- Agency: Loudermilk & Associates
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An apparatus measuring optical characteristics including position detection is disclosed. A processor is coupled to a display. A first optical sensor makes a first measurement and a second optical sensor makes a second measurement. A source of illumination provides illumination in the IR range it and the first optical sensor determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object. A position of the apparatus with respect to an object and an optical property of light received by the apparatus are determined. A transparent member having a thickness less than the minimal distance may be provided through which the source provides illumination and receives illumination external to the apparatus.
Public/Granted literature
- US20130020485A1 Apparatus for Measuring Optical Characteristics Including Position Detection Public/Granted day:2013-01-24
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