Invention Grant
- Patent Title: Multiwavelength thermometer
- Patent Title (中): 多波长温度计
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Application No.: US12627293Application Date: 2009-11-30
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Publication No.: US08790006B2Publication Date: 2014-07-29
- Inventor: Hejie Li , Rodrick Gordon Brown , Samhita Dasgupta , Edward Randall Furlong , Nirm Velumylum Nirmalan , Anquan Wang , Guanghua Wang , Stephen Thomas Walls
- Applicant: Hejie Li , Samhita Dasgupta , Edward Randall Furlong , Nirm Velumylum Nirmalan , Anquan Wang , Guanghua Wang , Stephen Thomas Walls , Lesley Ellen Brown
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Joseph J. Christian
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01K1/14 ; G01K11/00

Abstract:
A thermal measurement system that includes a light collection device and a detection system in communication with the device. The detection system includes two detection subsystems, wherein one subsystem is configured to detect light from a surface of an object, while the other subsystem is configured to detect light from the surface and a gas. The present invention has been described in terms of specific embodiment(s), and it is recognized that equivalents, alternatives, and modifications, aside from those expressly stated, are possible and within the scope of the appending claims.
Public/Granted literature
- US20110128989A1 MULTIWAVELENGTH THERMOMETER Public/Granted day:2011-06-02
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