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US08791504B2 Substrate breakdown voltage improvement for group III-nitride on a silicon substrate 有权
硅衬底上III族氮化物的衬底击穿电压提高

Substrate breakdown voltage improvement for group III-nitride on a silicon substrate
Abstract:
A circuit structure includes a substrate, a nucleation layer of undoped aluminum nitride, a graded buffer layer comprising aluminum, gallium, nitrogen, one of silicon and oxygen, and a p-type conductivity dopant, a ungraded buffer layer comprising gallium, nitrogen, one of silicon and oxygen, and a p-type conductivity dopant without aluminum, and a bulk layer of undoped gallium nitride over the ungraded buffer layer. The various dopants in the graded buffer layer and the ungraded buffer layer increases resistivity and results in layers having an intrinsically balanced conductivity.
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