Invention Grant
- Patent Title: Monitoring system for testing apparatus
- Patent Title (中): 检测仪器监控系统
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Application No.: US13478264Application Date: 2012-05-23
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Publication No.: US08791813B2Publication Date: 2014-07-29
- Inventor: Dong Chen
- Applicant: Dong Chen
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110228034 20110810
- Main IPC: G08B29/00
- IPC: G08B29/00

Abstract:
A monitoring system includes a testing apparatus and a display control apparatus connected to the testing apparatus. The testing apparatus includes a plurality of testing locations and a collection module connected to the plurality of testing locations. Each of the plurality of testing locations receives a tested product, which is tested by the testing apparatus. The collection module collects testing states of the tested products. A display apparatus is connected to the display control apparatus. The display control apparatus controls the display apparatus to show a plurality of indicating blocks corresponding to the plurality of testing locations. The display apparatus is adapted to display the plurality of indicating blocks to match the plurality of testing locations. The display control apparatus controls each of the plurality of indicating blocks to show the testing state of the tested product in each the plurality of testing locations.
Public/Granted literature
- US20130038460A1 MONITORING SYSTEM FOR TESTING APPARATUS Public/Granted day:2013-02-14
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