Invention Grant
- Patent Title: Extended select gate lifetime
- Patent Title (中): 扩展选择栅极寿命
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Application No.: US13528966Application Date: 2012-06-21
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Publication No.: US08792283B2Publication Date: 2014-07-29
- Inventor: Yogesh B. Wakchaure , Kiran Pangal , Xin Guo , Qingru Meng , Hanmant Belgal
- Applicant: Yogesh B. Wakchaure , Kiran Pangal , Xin Guo , Qingru Meng , Hanmant Belgal
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Cool Patent, P.C.
- Main IPC: G11C16/16
- IPC: G11C16/16 ; G11C16/10 ; G11C16/26 ; H01L27/115

Abstract:
A memory device may include two or more memory cells in an integrated circuit, at least one flash cell acting as a select gate coupled to the two or more memory cells, and an interface to accept a select gate erase command and a select gate program command during normal operation of the integrated circuit. The integrated circuit may be capable to perform operations to erase the at least one select gate in response to the select gate erase command, and program the at least one select gate in response to the select gate program command.
Public/Granted literature
- US20130343129A1 EXTENDED SELECT GATE LIFETIME Public/Granted day:2013-12-26
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