Invention Grant
- Patent Title: Channel marking for chip mark overflow and calibration errors
- Patent Title (中): 通道标记用于芯片标记溢出和校准错误
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Application No.: US12981017Application Date: 2010-12-29
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Publication No.: US08793544B2Publication Date: 2014-07-29
- Inventor: Judy S. Johnson , Luis A. Lastras-Montano , Patrick J. Meaney , Eldee Stephens
- Applicant: Judy S. Johnson , Luis A. Lastras-Montano , Patrick J. Meaney , Eldee Stephens
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Margaret McNamara
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00 ; G11C29/44 ; G06F11/30 ; G06F11/10
Abstract:
Marking memory chips as faulty when a fault is detected in data from the memory chip. Upon detecting that a plurality of memory chips are faulty, determining which of a plurality of memory channels contains the faulty memory chips. Marking one of a plurality of memory channels as failing in response to determining that the number of failing memory chips has exceeded a threshold.
Public/Granted literature
- US20120173936A1 CHANNEL MARKING FOR CHIP MARK OVERFLOW AND CALIBRATION ERRORS Public/Granted day:2012-07-05
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