Invention Grant
- Patent Title: Instrument docking station for an automated testing system
- Patent Title (中): 仪器对接站用于自动化测试系统
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Application No.: US12481014Application Date: 2009-06-09
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Publication No.: US08795593B2Publication Date: 2014-08-05
- Inventor: Michael J. Nichols , Louis J. Guarracina
- Applicant: Michael J. Nichols , Louis J. Guarracina
- Agency: Hoffman Warnick LLC
- Main IPC: G01N35/00
- IPC: G01N35/00 ; B01L9/02 ; B01L3/00 ; G01N35/04

Abstract:
An automated testing system includes one or more laboratory devices that operate together to perform an assay. The testing system is designed such that a laboratory device may be seamlessly integrated with the remaining devices in a quick and effortless manner. Specifically, the laboratory device is securely mounted on a slidable cart with fluid and electrical connections established therebetween. The slidable cart is in turn adapted to releasably engage with a docking station that is fixedly mounted on the workspace floor, the docking station being provided with at least one fluid input connection, an input power connection and at least one communication signal connection that are relatively permanent in nature. In order to couple the cart to the docking station, the cart is rolled generally into position above the docking station using complementary alignment posts and tracks.
Public/Granted literature
- US20090246081A1 INSTRUMENT DOCKING STATION FOR AN AUTOMATED TESTING SYSTEM Public/Granted day:2009-10-01
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