An electrophotographic photoconductor having a photosensitive layer and a crosslinked resin surface layer over a support, wherein shapes of concaves and convexes in a surface of the electrophotographic photoconductor are measured by a surface roughness/profile measuring device to obtain one-dimensional data arrays, the arrays are subjected to multiresolution analysis (MRA-1) through wavelet transformation to be separated into six frequency components including HHH, HHL, HMH, HML, HLH and HLL to obtain one-dimensional data arrays, the arrays of the HHL are thinned out to be reduced 1/10 to 1/100, thereby producing one-dimensional data arrays, which are then subjected to multiresolution analysis (MRA-2) through wavelet transformation to be separated into six frequency components including LHH, LHL, LMH, LML, LLH and LLL to thereby obtain 12 frequency components in total; and a center-line average roughness (WRa) of the 12 frequency components satisfies relationship (i) below. 1−597×WRa(HML)+238×WRa(HLH)−95×WRa(LHL)+84×WRa(LMH)−79×WRa(LML)+55×WRa(LLH)−17×WRa(LLL)>0  (i)